Suwon, South Korea

Kang Hee Han

This inventor holds 1 USPTO granted patent. Top assignee: Udmtek Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kang Hee Han. Retrieved from https://idiyas.com/inventor/kang-hee-han-rui62hll

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Kang Hee Han

Introduction

Kang Hee Han is a notable inventor based in Suwon-Si, South Korea. He has made significant contributions to the field of programmable logic controllers (PLC) through his innovative patent. His work focuses on enhancing the efficiency and accuracy of PLC control logic inspections.

Latest Patents

Kang Hee Han holds a patent for a "Graph neural network based PLC control logic automatic inspection method." This method utilizes a graphic neural network (GNN) to inspect PLC control logic. The process involves three key operations: data preprocessing for the GNN, predicting tag connections, and verifying the suitability of edge connections between tags. The outcome is a graph generated from the PLC control logic, which is then analyzed to identify incorrect connections. This innovative approach significantly improves the reliability of PLC systems.

Career Highlights

Kang Hee Han is currently employed at Udmtek Co., Ltd., where he continues to develop cutting-edge technologies in automation and control systems. His expertise in graph neural networks has positioned him as a leader in the field of PLC inspections.

Collaborations

Kang collaborates with Jun Pyo Park, enhancing the research and development efforts at Udmtek Co., Ltd. Their combined expertise fosters innovation and drives advancements in automation technologies.

Conclusion

Kang Hee Han's contributions to the field of PLC control logic inspections through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances the efficiency of inspections but also sets a new standard in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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