Kanagawa, Japan

Kaname Ogawa

This inventor holds 29 USPTO granted patents and 2 EPO patents, primarily in Image Processing Technology. Top assignees: Sony Corporation, Lenovo (Beijing) Limited. Active years: 2010-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaname Ogawa. Retrieved from https://idiyas.com/inventor/kaname-ogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 24.1

 

Average Co-Inventor Count = 1.3

ph-index = 6

Forward Citations = 137(Granted Patents)


Location History:

  • Kanagawa, JP (2010 - 2017)
  • Beijing, CN (2014 - 2019)

Company Filing History:


Years Active: 2010-2019

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Areas of Expertise:
Image Processing
Object Tracking
Information Processing
Facial Expression Evaluation
Image Capturing
Recording Medium
Imaging Apparatus
Encoding Method
Similarity Calculation
Control Method
29 patents (USPTO):Explore Patents

Title: Kaname Ogawa: Pioneering Inventor from Kanagawa, JP

Introduction: Kaname Ogawa is a renowned inventor hailing from Kanagawa, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kaname Ogawa holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Kaname Ogawa has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Kaname Ogawa has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Kaname Ogawa's dedication to pushing the boundaries of technology and his passion for creating solutions to complex problems make him a true visionary in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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