Yokohama, Japan

Kaname Miyata

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaname Miyata. Retrieved from https://idiyas.com/inventor/kaname-miyata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Kaname Miyata: Inventor of a Simple Shock and Tilt Detection Indicator.

Introduction

Kaname Miyata is an inventor associated with Yokohama, Japan, and International Business Machines Corporation. His patent work addresses a practical challenge: detecting when an article has tipped or experienced a shock using a simple, low-cost structure.

Latest Patents

Miyata is associated with 1 patent, titled “Indicator, Detector, and Detection Method.” The invention describes an indicator that moves away from a holding guide when a detector tilts beyond a specified limit. It has a larger first part that rolls along the guide and a smaller second part designed not to obstruct that rolling motion. The two parts join together and separate when subjected to a shock, enabling detection of both excessive tilting and impact.

Career Highlights

Miyata’s patent reflects an emphasis on straightforward detection mechanisms that can help identify mishandling of articles without requiring a complex or costly structure. His work is associated with International Business Machines Corporation.

Collaborations

Miyata’s listed coworkers include Hideo Igami and Yuhta Ishii.

Conclusion

Kaname Miyata’s patent presents a compact approach to detecting tilt and shock, combining a rolling indicator with a separable component to support simple, low-cost monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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