Tokyo, Japan

Kanako Sugawara

This inventor holds 1 USPTO granted patent. Top assignee: Hoya Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kanako Sugawara. Retrieved from https://idiyas.com/inventor/kanako-sugawara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Kanako Sugawara: Innovator in Imaging Technology

Introduction

Kanako Sugawara is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of imaging technology, showcasing her innovative spirit through her patented inventions.

Latest Patents

Sugawara holds a patent for an imaging unit that includes an imaging device, an imaging device driver, and a signal-processing block. This invention features pixels arranged in a first direction, which are alternately covered with different color filters. The imaging device driver is responsible for driving the imaging device, while the signal-processing block averages pixel signals from multiple pixel blocks for each color filter. This innovative approach enhances the efficiency and quality of imaging technology.

Career Highlights

Kanako Sugawara is associated with Hoya Corporation, a leading company in optical products and imaging technology. Her work at Hoya has allowed her to develop cutting-edge solutions that push the boundaries of imaging capabilities.

Collaborations

Sugawara collaborates with her coworker, Akifumi Tabata, to further advance their research and development efforts in imaging technology.

Conclusion

Kanako Sugawara's contributions to imaging technology through her innovative patents exemplify her dedication to advancing the field. Her work continues to inspire future developments in imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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