Company Filing History:
Years Active: 2016-2017
Title: Kamil S Salloum: Innovator in Probe Technology
Introduction
Kamil S Salloum is a notable inventor based in Hillsboro, OR (US). He has made significant contributions to the field of probe technology, holding 2 patents that showcase his innovative approach to die sort and test processes.
Latest Patents
One of his latest patents is titled "Probe tip formation for die sort and test." This invention describes a method for preparing the tips of wires in a test probe head for effective use. In this example, the wires are attached to a test probe head substrate, with the tips being polished to form a sharpened point. This enhancement improves the efficiency and accuracy of testing processes.
Another significant patent is the "Composite wire probe test assembly." This invention includes a substrate with a conductive trace and a layer that defines at least one cavity extending to the conductive trace. An electrical probe is disposed within this cavity, coupled to the conductive trace with solder. The electrical probe features a high yield strength wire core made from refractory metal, surrounded by a thin oxidation protection layer. This design ensures durability and reliability in testing applications.
Career Highlights
Kamil S Salloum is currently employed at Intel Corporation, where he continues to innovate and develop advanced technologies. His work at Intel has positioned him as a key player in the field of semiconductor testing.
Collaborations
Throughout his career, Kamil has collaborated with notable colleagues, including Kip P Stevenson and Todd P Albertson. These partnerships have contributed to the advancement of technology in their respective fields.
Conclusion
Kamil S Salloum's contributions to probe technology through his patents reflect his dedication to innovation and excellence. His work at Intel Corporation and collaborations with esteemed colleagues further highlight his impact on the industry.