Neu-Isenburg, Germany

Kamal Galrani

This inventor holds 1 USPTO granted patent. Top assignee: Tvarit Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kamal Galrani. Retrieved from https://idiyas.com/inventor/kamal-galrani-5y3s7arx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kamal Galrani: AI-Driven Recipe Optimization for Manufacturing

Introduction

Kamal Galrani is an inventor based in Neu-Isenburg, Germany. His patent work focuses on applying artificial intelligence and physics-based simulation to recommend recipes for manufacturing processes.

Latest Patents

Galrani is associated with 1 patent, titled “System and Method for Recommending a Recipe in a Manufacturing Process.” The invention describes a computer-implemented method that uses experimental data from a machine to build a physics-based simulation model. The model generates synthetic data for candidate recipes, while a trained AI model analyzes the experimental and synthetic data to determine optimized physical ranges for recipe parameters. The method then generates and validates additional recipes through simulation, selects an optimized recipe, and recommends it for producing a product on the machine.

Career Highlights

Galrani works at Tvarit GmbH. His patented approach combines machine data, simulation, and AI to support recipe selection in manufacturing, with the aim of identifying and validating suitable production settings.

Collaborations

The provided information lists Jiteshkumar Pareshkumar Vasavada and Manthan Dhisale as Galrani’s coworkers. Their shared professional context connects them to work at Tvarit GmbH.

Conclusion

Kamal Galrani’s patent presents a data-driven method for optimizing manufacturing recipes by combining experimental evidence, physics-based simulation, and AI.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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