Yerrupalem, India

Kakumanu Ambika K

This inventor holds 1 USPTO granted patent. Top assignee: Sandisk Technologies Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kakumanu Ambika K. Retrieved from https://idiyas.com/inventor/kakumanu-ambika-k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kakumanu Ambika K and Secure Access to Protected Data

Introduction

Kakumanu Ambika K is an inventor based in Yerrupalem, India, whose patent work concerns secure access to protected memory in data storage devices. He is associated with SanDisk Technologies Inc. and is listed as a co-inventor with Mayur Dipchand Jain. The provided information lists 1 patent for him.

Latest Patents

His listed patent, “Access Control System and a Data Storage Device,” describes a system and method for allowing an authorized host computing system to access replay protected memory blocks (RPMB) in a data storage device. The access control system determines whether the host is authorized and securely programs the host and storage device with at least one RPMB key. The device then uses that key to authenticate requests to access the protected memory blocks.

Career Highlights

Ambika K’s listed invention addresses authentication and authorization in data storage. By using an RPMB key to verify access requests, the system is designed to help protect sensitive memory blocks from unauthorized access. His patent is associated with SanDisk Technologies Inc.

Collaborations

Mayur Dipchand Jain is identified as a co-inventor on the patent, reflecting a collaboration on the access-control system and data-storage technology.

Conclusion

Kakumanu Ambika K’s listed patent focuses on securing access to replay protected memory blocks through authorization checks and key-based authentication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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