Dongguan, China

Kaidi Zhao

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaidi Zhao. Retrieved from https://idiyas.com/inventor/kaidi-zhao-avlbsm89

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kaidi Zhao and Optical Network Fault-Locating Innovation.

Introduction

Kaidi Zhao is an inventor associated with Dongguan, China, and Huawei Technologies Co., Ltd. His patent work addresses fault detection in optical networks, where accurate diagnosis can help improve network reliability and reduce troubleshooting complexity.

Latest Patents

Zhao is associated with 1 patent: “Fault Locating Method for Optical Network and Related Device.” The invention describes a method in which a network management device obtains a set of optical-power measurements collected sequentially by an optical network device during a fault-locating period. At least one measurement is at or below a specified threshold. The network management device analyzes the measurements’ changing trend to determine the type of fault. The approach is intended to simplify fault locating and improve its accuracy and efficiency.

Career Highlights

Zhao’s listed patent reflects work on optical communications and network management. By using trends in sampled optical power to identify fault types, the method offers a way to support more efficient diagnosis in optical networks.

Collaborations

The patent lists Yangjun Wan, a woman, as Zhao’s coworker. The available information identifies their professional association but does not specify their individual contributions to the invention.

Conclusion

Kaidi Zhao’s patent focuses on using optical-power measurements to make network fault locating simpler, more accurate, and more efficient.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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