Singapore, Singapore

Kai Xun Juay

This inventor holds 1 USPTO granted patent. Top assignee: Sap Se. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kai Xun Juay. Retrieved from https://idiyas.com/inventor/kai-xun-juay

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Kai Xun Juay

Introduction

Kai Xun Juay is an accomplished inventor based in Singapore, SG. He has made significant contributions to the field of machine learning through his innovative patent. His work focuses on enhancing the robustness of version changes in machine learning applications.

Latest Patents

Kai Xun Juay holds a patent for an "Automated regression detection framework for supporting robust version changes of machine learning applications." This patent encompasses methods, systems, and computer-readable storage media designed to improve regression testing. The framework includes a project structure representing a regression test file directory, a set of test scenarios, and processes for executing test inference jobs. It calculates prediction scores based on actual and expected results, allowing for the selective indication of regression in machine learning models.

Career Highlights

Kai Xun Juay is currently employed at SAP SE, where he continues to develop innovative solutions in the tech industry. His expertise in machine learning and regression testing has positioned him as a valuable asset to his team and the company.

Collaborations

One of his notable coworkers is Denny Jee King Gee, with whom he collaborates on various projects within the company.

Conclusion

Kai Xun Juay's contributions to machine learning through his patent demonstrate his commitment to innovation and excellence in technology. His work continues to influence the development of robust applications in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…