Singapore, Singapore

Kai Ping Huang

This inventor holds 1 USPTO granted patent. Top assignee: United Semiconductor (Xiamen) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kai Ping Huang. Retrieved from https://idiyas.com/inventor/kai-ping-huang-7ht807ai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Kai Ping Huang

Introduction

Kai Ping Huang is a notable inventor based in Singapore, SG. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the detection of defects in wafers, which is crucial for the manufacturing process in the semiconductor industry.

Latest Patents

Huang holds a patent titled "Method for Detecting Defects on Wafers, System for Detecting Defects on Wafers." This patent showcases his innovative approach to enhancing the quality control processes in semiconductor fabrication. His expertise in this area is reflected in his patent, which addresses critical challenges faced by manufacturers.

Career Highlights

Huang is currently employed at United Semiconductor (Xiamen) Co., Ltd. His role at the company allows him to apply his knowledge and skills in a practical setting, contributing to advancements in semiconductor technology. His work has been instrumental in developing more efficient methods for defect detection.

Collaborations

Huang has collaborated with talented coworkers, including Yu Peng Hong and Qingrong Chen. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Kai Ping Huang's contributions to the semiconductor industry through his patent and collaborative efforts highlight his role as an influential inventor. His work continues to impact the field positively, paving the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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