Fremont, CA, United States of America

Kai Chieh Chan

This inventor holds 1 USPTO granted patent. Top assignee: Marvell International Limited. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kai Chieh Chan. Retrieved from https://idiyas.com/inventor/kai-chieh-chan-a9k5bte4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Kai Chieh Chan

Introduction

Kai Chieh Chan is an accomplished inventor based in Fremont, CA. She has made significant contributions to the field of calibration testing, particularly through her innovative patent. Her work is instrumental in enhancing manufacturing processes and ensuring product quality.

Latest Patents

Kai Chieh Chan holds a patent titled "Reducing Calibration Testing Time." This patent outlines a method that applies an average radio calibration result obtained from one or more units of a manufacturing order to another unit. It also includes performing a verification test on the other unit to determine whether it meets pre-determined specifications. This innovation is crucial for streamlining calibration processes in manufacturing.

Career Highlights

Currently, Kai Chieh Chan is employed at Marvell International Limited, where she continues to develop and refine her innovative ideas. Her expertise in calibration testing has positioned her as a valuable asset to her team and the company.

Collaborations

Kai Chieh Chan collaborates with various professionals in her field, including her coworker, Marc Jacobs. Their combined efforts contribute to the advancement of technology and innovation within their organization.

Conclusion

Kai Chieh Chan's contributions to the field of calibration testing through her patent demonstrate her commitment to innovation and excellence. Her work at Marvell International Limited continues to impact the manufacturing industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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