Yongin, South Korea

Kae Young Shin

This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignee: Samsung Sds Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kae Young Shin. Retrieved from https://idiyas.com/inventor/kae-young-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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3 patents (USPTO):Explore Patents

Title: Innovations by Kae Young Shin

Introduction

Kae Young Shin is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of defect identification and clustering in manufacturing processes. With a total of 3 patents, his work focuses on improving the efficiency and accuracy of defect detection in production lines.

Latest Patents

One of Kae Young Shin's latest patents is titled "Method and apparatus for identifying root cause of defect using composite defect map." This invention provides a method for automatically determining defective equipment by utilizing a sample defect map that illustrates defect distribution across various cells of a defective sample. The method involves generating a sample defect map, creating an equipment defect map for the equipment involved, calculating map similarity, and identifying defective equipment based on this analysis.

Another significant patent is the "Defect cell clustering method and apparatus thereof." This invention outlines a method for clustering defects found in bad samples displayed on a defect map. It includes generating a sample defect map, selecting cell positions with defects as clustering targets, and grouping these targets based on the coherence of their positions and suspected bad equipment.

Career Highlights

Kae Young Shin is currently employed at Samsung SDS Co., Ltd., where he applies his expertise in defect analysis and equipment optimization. His innovative approaches have contributed to advancements in manufacturing technologies, enhancing product quality and operational efficiency.

Collaborations

Throughout his career, Kae Young Shin has collaborated with notable colleagues, including Dae Jung Ahn and Min Kyun Doo. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and innovative solutions.

Conclusion

Kae Young Shin's contributions to the field of defect identification and clustering have made a significant impact on manufacturing processes. His innovative patents reflect his commitment to enhancing product quality and operational efficiency in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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