Cambridge, United Kingdom

Kadi Liis Saar

This inventor holds 1 USPTO granted patent and 8 published patent applications and 2 EPO patents. Top assignee: University of Cambridge. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kadi Liis Saar. Retrieved from https://idiyas.com/inventor/kadi-liis-saar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Kadi Liis Saar: Innovator in Optical Microscopy

Introduction

Kadi Liis Saar is a prominent inventor based in Cambridge, GB. She has made significant contributions to the field of optical microscopy, particularly through her innovative methods that enhance particle detection.

Latest Patents

Kadi Liis Saar holds a patent for a method of increasing the interference contrast in interferometric scattering optical microscopy. This method involves providing a particle detection region with a chamber or channel defined by interfaces. It includes illuminating a particle with coherent light at an oblique angle, capturing the reflected and scattered light using an objective lens, and imaging the interference between these light components.

Career Highlights

Kadi Liis Saar is associated with Cambridge Enterprise Limited, where she applies her expertise in optical microscopy. Her work has led to advancements in the detection and imaging of particles, showcasing her innovative approach to scientific challenges.

Collaborations

Kadi has collaborated with notable colleagues, including Tuomas Pertti Jonathan Knowles and Pavan Kumar Challa. These collaborations have further enriched her research and development efforts in the field.

Conclusion

Kadi Liis Saar's contributions to optical microscopy exemplify her innovative spirit and dedication to advancing scientific knowledge. Her patent reflects her commitment to enhancing particle detection methods, making her a valuable figure in her field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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