Lawrence Township, NJ, United States of America

Kaan Bardak

This inventor holds 1 USPTO granted patent and 1 published patent application, plus 1 CIPO patent and 1 EPO patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaan Bardak. Retrieved from https://idiyas.com/inventor/kaan-bardak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0


 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Kaan Bardak: Inventor in Industrial Network Security.

Introduction

Kaan Bardak is an inventor based in Lawrence Township, New Jersey. His work includes a patent focused on identifying unauthorized or unusual engineering changes to programmable logic controllers (PLCs), which are used in industrial control systems.

Latest Patents

Bardak is associated with 1 patent, titled “Identification of Deviant Engineering Modifications to Programmable Logic Controllers.” The invention describes methods and computer systems that collect and store network traffic from engineering stations connected to PLCs. The system compares traffic data to detect deviant modifications and can generate reports and alarms. It may also block network traffic associated with those modifications.

Career Highlights

Bardak works at Siemens Aktiengesellschaft. His patent addresses the monitoring of engineering activity and the detection of potentially unauthorized changes in industrial control environments.

Collaborations

Bardak’s listed coworkers include Lesley Morgan and Nicholas Nichols.

Conclusion

Kaan Bardak’s patented work applies network monitoring and anomaly detection to help identify and respond to deviant engineering modifications to programmable logic controllers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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