Ka Wai Chan

Title: Innovations of Ka Wai Chan in Semiconductor Testing

Introduction

Ka Wai Chan is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of semiconductor testing, particularly with his innovative designs that enhance testing efficiency. With a focus on improving throughput in die testing, Chan's work is essential for advancing semiconductor technology.

Latest Patents

One of Ka Wai Chan's key patents is titled "Apparatus for testing multiple semiconductor dice with increased throughput." This invention features a die tester that includes a testing table capable of accommodating multiple dice arranged in an array. The design incorporates a first probe and a second probe that can be adjusted to a fixed position, maintaining a specific separation distance. This configuration allows for precise testing at predetermined points on the dice. The testing table and probes are designed to move relative to each other, enabling effective positioning for testing various dice.

Career Highlights

Ka Wai Chan is currently employed at Asm Technology Singapore Pte Ltd, where he continues to innovate in the semiconductor testing domain. His work has been instrumental in developing technologies that streamline the testing process, thereby increasing efficiency and reliability in semiconductor manufacturing.

Collaborations

Throughout his career, Chan has collaborated with talented colleagues, including Yam Mo Wong and Kui Kam Lam. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Ka Wai Chan's contributions to semiconductor testing through his innovative patent demonstrate his commitment to enhancing technology in this critical field. His work not only reflects his expertise but also paves the way for future advancements in semiconductor testing methodologies.