This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials Gmbh & Co Kg. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Jürgen Schroeder: Innovator in Optical Layer Measurement
Introduction
Jürgen Schroeder is a notable inventor based in Groβkrotzenburg, Germany. He has made significant contributions to the field of optical measurements, particularly through his innovative methods for determining the physical properties of optical layers.
Latest Patents
Schroeder holds a patent for a method of determining physical properties of an optical layer or layer system. This invention utilizes spectral transmission and/or reflection measurements to ascertain the wavelength-dependent refractive indices and extinction coefficients. The method involves selecting reference values from known data or determining them experimentally, with the variation characterized by wavelength-independent constants.
Career Highlights
Jürgen Schroeder is associated with Applied Materials GmbH & Co. KG, where he applies his expertise in optical technologies. His work has been instrumental in advancing the understanding of optical layers, which are crucial in various applications, including semiconductor manufacturing and optical devices.
Collaborations
One of his notable collaborators is Hans-Georg Lotz, with whom he has worked closely on various projects related to optical measurements.
Conclusion
Jürgen Schroeder's contributions to the field of optical layer measurement highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in understanding optical properties, which can have far-reaching implications in multiple industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile