Germering, Germany

Jürgen Neumann

This inventor holds 1 USPTO granted patent. Top assignee: Dornier Medtech Systems, Gmbh. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürgen Neumann. Retrieved from https://idiyas.com/inventor/jürgen-neumann-678wcgey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Jürgen Neumann: Innovator in X-Ray Technology

Introduction

Jürgen Neumann is a notable inventor based in Germering, Germany. He has made significant contributions to the field of medical technology, particularly in x-ray devices. His innovative work has led to the development of a patented apparatus that enhances the accuracy of air-kerma rate measurements.

Latest Patents

Neumann holds a patent for an "Apparatus and method for determining air-kerma rate." This invention includes a data obtaining component that collects data from the x-ray device, a calculation component that computes the air-kerma rate using an algebraic formula, and an outputting component that displays the calculated air-kerma rate. This patent represents a significant advancement in ensuring the safety and effectiveness of x-ray technology.

Career Highlights

Jürgen Neumann is currently employed at Dornier Medtech Systems GmbH, where he continues to work on innovative solutions in medical technology. His expertise in x-ray systems has positioned him as a valuable asset in the field, contributing to advancements that improve patient care.

Collaborations

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Conclusion

Jürgen Neumann's contributions to x-ray technology through his innovative patent demonstrate his commitment to enhancing medical devices. His work continues to impact the field positively, ensuring safer and more effective medical imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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