This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Innovations by Júlia Fekete in Microscopy Technology
Introduction
Júlia Fekete is a notable inventor based in Budapest, Hungary. He has made significant contributions to the field of microscopy through his innovative patent. His work focuses on enhancing the capabilities of microscopic imaging systems, which are crucial for various scientific applications.
Latest Patents
Júlia Fekete holds a patent for a "Real-time, 3D, non-linear microscope measuring system and method for application of the same." This invention provides a method for examining a set of microscopic image points across different image planes. The system utilizes a pulsed laser or parametric oscillator light source to generate an examining optical signal. It is designed to measure and photochemically stimulate pre-selected points within a short time interval. The system includes a bundle of fibers made of optical fibers or other waveguides, a rapidly working optical switch, an imaging system, a light source, and an optical system. The examining optical signal can be a fluorescent or other optical signal that is imaged on the required spot.
Career Highlights
Throughout his career, Júlia Fekete has demonstrated a commitment to advancing microscopy technology. His innovative approach has led to the development of systems that improve the efficiency and effectiveness of microscopic examinations. His patent reflects his expertise and dedication to the field.
Collaborations
Júlia has collaborated with esteemed colleagues such as Szilveszter E Vizi and Róbert Szipöcs. These collaborations have contributed to the refinement and success of his innovative projects.
Conclusion
Júlia Fekete's contributions to microscopy technology through his patented innovations highlight his role as a leading inventor in the field. His work continues to influence the way microscopic examinations are conducted, paving the way for future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile