Taoyuan, Taiwan

Jyun-Kai Chen

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Delta Electronics, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jyun-Kai Chen. Retrieved from https://idiyas.com/inventor/jyun-kai-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jyun-Kai Chen and Battery Rack Failure Detection

Introduction

Jyun-Kai Chen is an inventor based in Taoyuan, Taiwan, associated with Delta Electronics, Inc. His patent work addresses the monitoring of battery racks and the detection of potentially hazardous voltage conditions.

Latest Patents

Chen is named on 1 patent, titled “Failure Detection Method and Failure Detection System for Battery Racks.” The invention continuously calculates voltage differences across battery racks and uses statistical analysis to identify unusual trends. It compares voltage trends from two periods, evaluates their intersection and slope, and generates an alarm when the results indicate an abnormal condition. The alarm identifies the battery cell experiencing an overvoltage status.

Career Highlights

Chen’s listed patent reflects work on battery monitoring and fault detection. By combining voltage measurements, trend analysis, and threshold-based alerts, the disclosed system is designed to help locate overvoltage conditions in battery racks.

Collaborations

Chen’s listed coworkers include Wen-Fong Huang and Shih-Hung Liu. The available information identifies these colleagues but does not specify their roles in the patent.

Conclusion

Jyun-Kai Chen’s patent focuses on detecting and locating battery-cell overvoltage through continuous voltage monitoring and trend analysis, contributing to the development of battery rack failure detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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