Oulu, Finland

Jyri Tolonen

This inventor holds 1 USPTO granted patent. Top assignee: Elektrobit Testing Oy. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jyri Tolonen. Retrieved from https://idiyas.com/inventor/jyri-tolonen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Jyri Tolonen: Innovator in Electronic Product Testing

Introduction

Jyri Tolonen is a notable inventor based in Oulu, Finland. He has made significant contributions to the field of electronic product testing. His innovative approach has led to the development of a unique method and product palette that enhances the efficiency of testing electronic products.

Latest Patents

Jyri Tolonen holds 1 patent for his invention titled "Method and product palette for testing electronic products." This invention features a product palette designed for carrying electronic products along a production line. The product palette is equipped with a signal interface that establishes a connection between the palette and the product. Additionally, it includes a test arrangement connected to the signal interface, which allows for subjecting the product to various test operations.

Career Highlights

Jyri Tolonen is currently employed at Elektrobit Testing Oy, where he continues to work on innovative solutions in the electronics sector. His expertise in product testing has positioned him as a valuable asset to the company and the industry at large.

Collaborations

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Conclusion

Jyri Tolonen's contributions to electronic product testing exemplify the impact of innovation in technology. His work not only enhances production efficiency but also sets a standard for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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