Komae, Japan

Jynichi Iida


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Jynichi Iida - Innovator in Contour Measurement Technology

Introduction

Jynichi Iida is a notable inventor based in Komae, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative contour measuring instrument. His work has been recognized for its precision and effectiveness in measuring the contours of various workpieces.

Latest Patents

Jynichi Iida holds 1 patent for his invention of a contour measuring instrument. This device is designed to measure the contour of the outer surface of a workpiece. The instrument features a stylus that is secured at one end of a rotational arm. When the stylus contacts the workpiece, it traces the irregularities of the surface. The vertical movement of the stylus, combined with the axial movement of the arm, allows for accurate contour measurement. Additionally, the instrument includes a mechanism to detect excessive force on the stylus, preventing breakage and damage to both the stylus and the workpiece.

Career Highlights

Jynichi Iida is associated with Mitutoyo Mfg. Co., Ltd., a company renowned for its precision measuring instruments. His work at Mitutoyo has allowed him to develop and refine his innovative measuring technologies. His contributions have played a crucial role in advancing measurement accuracy in various industries.

Collaborations

Jynichi Iida has collaborated with Seiji Sakagami, a fellow innovator in the field. Their partnership has fostered the development of advanced measurement solutions, enhancing the capabilities of measuring instruments.

Conclusion

Jynichi Iida's contributions to contour measurement technology exemplify his dedication to innovation and precision. His patented contour measuring instrument represents a significant advancement in the field, showcasing his expertise and commitment to improving measurement techniques.

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