The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 1983
Filed:
Feb. 18, 1981
Jynichi Iida, Komae, JP;
Seiji Sakagami, Kawasaki, JP;
Mitutoyo Mfg. Co., Ltd., Tokyo, JP;
Abstract
A measuring instrument for measuring the contour of the outer surface of a workpiece. This measuring instrument is of such an arrangement that the tip end of a stylus solidly secured at one end of an arm adapted for rotational movement is brought into contact with the outer surface of the workpiece by a slight pressing force, the arm in this condition is moved in the axial direction thereof, and the displacement of the stylus tracing the irregularities of the outer surface of the workpiece to vertically move due to the abovedescribed movement is converted into the rotational movement of the arm, which is measured by measuring means such as a differential transformer, whereby the contour of the outer surface of the workpiece is measured from the vertical movement of the stylus and the axial (or horizontal) movement of the arm. The arm of the measuring instrument of this type has a dual construction adapted to be held in place by means of springs, wherein a mechanism for detecting the relative movement between these dual arms is provided, whereby a force exceeding a predetermined value applied to the stylus is detected, so that the breakage of the stylus, damages of the object to be measured and the like can be prevented.