Company Filing History:
Years Active: 2020
Title: Justyna Wiedemair: Innovator in X-ray Fluorescence Analysis
Introduction
Justyna Wiedemair is a notable inventor based in Almelo, Netherlands. She has made significant contributions to the field of X-ray fluorescence (XRF) analysis, particularly in the analysis of layered samples. Her innovative approach has the potential to enhance the accuracy and efficiency of measurements in various applications.
Latest Patents
Justyna holds a patent for a method of making X-ray fluorescence measurements of layered samples. The patent describes a technique where at least two measurements are made, one through one surface of the sample and another through the opposite surface. This method can be conveniently executed by inverting the sample between measurements. The data obtained from these additional measurements can be utilized to calculate multiple parameters of the sample, such as concentration, density, or thickness of each layer.
Career Highlights
Justyna is currently employed at Malvern Panalytical B.V., where she continues to develop her expertise in analytical techniques. Her work focuses on advancing the capabilities of XRF technology, contributing to the company's reputation as a leader in analytical instrumentation.
Collaborations
Justyna collaborates with her coworker, Armand Jonkers, to further enhance the research and development efforts at Malvern Panalytical B.V. Their combined expertise fosters innovation and drives the advancement of analytical methods.
Conclusion
Justyna Wiedemair is a pioneering inventor whose work in X-ray fluorescence analysis is making a significant impact in the field. Her innovative methods and dedication to research continue to push the boundaries of analytical technology.