The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Dec. 20, 2017
Applicant:
Malvern Panalytical B.v., Almelo, NL;
Inventors:
Armand Jonkers, Almelo, NL;
Justyna Wiedemair, Almelo, NL;
Assignee:
MALVERN PANALYTICAL B.V., Almelo, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/076 (2013.01); G01N 2223/615 (2013.01); G01N 2223/633 (2013.01);
Abstract
A method of making X-ray fluorescence, XRF, measurements of a layered sample is described. At least two measurements are made, one through one surface of the sample and another through the opposite surface. This may be conveniently done by inverting the sample between the measurements. The data from the additional measurements may be used to calculate multiple parameters of the sample, such as the concentration, density or thickness of each of the layers.