Company Filing History:
Years Active: 2020
Title: Armand Jonkers: Innovator in X-ray Fluorescence Analysis
Introduction
Armand Jonkers is a notable inventor based in Almelo, Netherlands. He has made significant contributions to the field of X-ray fluorescence (XRF) analysis. His innovative methods have advanced the way layered samples are measured and analyzed.
Latest Patents
Jonkers holds a patent for a method of making X-ray fluorescence measurements of layered samples. This patent describes a technique where at least two measurements are made, one through one surface of the sample and another through the opposite surface. The process may involve inverting the sample between measurements. The data obtained from these additional measurements can be utilized to calculate various parameters of the sample, including concentration, density, and thickness of each layer.
Career Highlights
Armand Jonkers is associated with Malvern Panalytical B.V., a company known for its expertise in analytical instrumentation. His work at the company has allowed him to focus on developing innovative solutions in the field of material analysis.
Collaborations
Jonkers collaborates with Justyna Wiedemair, contributing to advancements in their shared field of expertise.
Conclusion
Armand Jonkers is a distinguished inventor whose work in X-ray fluorescence analysis has paved the way for improved measurement techniques. His contributions continue to influence the field and enhance the understanding of layered materials.