Norwalk, CT, United States of America

Justin F Aiello

This inventor holds 7 USPTO granted patents and 2 published patent applications. Top assignee: Mytech Corporation. Active years: 1998-2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Justin F Aiello. Retrieved from https://idiyas.com/inventor/justin-f-aiello

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 100.0

Average Co-Inventor Count = 3.5

ph-index = 7

Forward Citations = 184(Granted Patents)


Location History:

  • Norwalk, CT (US) (1998 - 1999)
  • Port Washington, NY (US) (2000 - 2001)

Company Filing History:


Years Active: 1998-2001

Loading Chart...
7 patents (USPTO):Explore Patents

Title: The Innovative Journey of Justin F. Aiello

Introduction

Justin F. Aiello is a prominent inventor based in Norwalk, Connecticut. He has made significant contributions to the field of technology, particularly in the development of occupancy sensors. With a total of seven patents to his name, Aiello has established himself as a key figure in innovation.

Latest Patents

Among his latest patents are the Multi-technology occupancy sensor and the Ultrasonic occupancy sensor. These inventions showcase his commitment to enhancing technology that improves energy efficiency and user experience in various environments.

Career Highlights

Aiello is currently employed at Mytech Corporation, where he continues to push the boundaries of technology. His work at the company has been instrumental in advancing the development of smart sensor technologies.

Collaborations

Throughout his career, Aiello has collaborated with notable colleagues, including R. Kurt Bender and Willfred Goldschmidt. These partnerships have contributed to the success of his projects and innovations.

Conclusion

Justin F. Aiello's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…