New York, NY, United States of America

Justin Chang

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Secure Identity, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Justin Chang. Retrieved from https://idiyas.com/inventor/justin-chang-5vcrgrx8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Justin Chang and Biometric Gallery Management at Crowded Venues.

Introduction

Justin Chang is an inventor based in New York, NY (US), associated with Secure Identity, LLC. His patent work addresses biometric identification in crowded venues, where quickly locating relevant biometric data can support efficient identification.

Latest Patents

Chang’s listed patent, “Biometric Gallery Management at Crowded Venues,” describes using mobile devices to identify people who are closest to a biometric identification station. A preliminary identification helps retrieve those individuals’ biometric data from a main gallery and populate a smaller local gallery. The system then attempts biometric identification using that local gallery, which may improve speed and accuracy while keeping likely relevant data available. Chang is credited with 1 patent.

Career Highlights

The available information highlights Chang’s work on managing biometric galleries for identification in busy settings. The patented approach focuses on selecting and organizing biometric data according to people’s proximity to the identification station.

Collaborations

Chang is associated with Secure Identity, LLC. The provided information does not specify additional collaborators or details about his role at the company.

Conclusion

Justin Chang’s listed patent presents a proximity-based method for organizing biometric data to support identification at crowded venues.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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