Bonheiden, Belgium

Jurgen Van Limbergen

This inventor holds 2 USPTO granted patents. Top assignee: Agfa-Gevaert. Active years: 2003-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jurgen Van Limbergen. Retrieved from https://idiyas.com/inventor/jurgen-van-limbergen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2003-2005

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2 patents (USPTO):Explore Patents

Title: Jurgen Van Limbergen: Innovator in X-ray Technology

Introduction

Jurgen Van Limbergen is a notable inventor based in Bonheiden, Belgium. He has made significant contributions to the field of medical imaging, particularly in X-ray technology. With a total of 2 patents, his work has advanced the capabilities of roentgen apparatus.

Latest Patents

Jurgen's latest patents include a cassette assembly designed for use with roentgen apparatus featuring automatic exposure control. This innovative cassette assembly comprises an X-ray cassette, which includes a tube side and a cover, along with an intensifying screen. The assembly is further enhanced by a compensation element that is adapted to the intensifying screen, allowing for predetermined X-ray absorption.

Career Highlights

Jurgen Van Limbergen is associated with Agfa-Gevaert, a company renowned for its imaging technology. His work at Agfa-Gevaert has positioned him as a key player in the development of advanced medical imaging solutions.

Collaborations

Throughout his career, Jurgen has collaborated with notable colleagues, including Rudy Van Den Bergh and Manfred Schmidt. These collaborations have contributed to the innovative projects he has undertaken.

Conclusion

Jurgen Van Limbergen's contributions to X-ray technology through his patents and work at Agfa-Gevaert highlight his role as an influential inventor in the medical imaging field. His innovations continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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