Dresden, Germany

Jürgen Peter Kernhof

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Renesas Electronics America Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürgen Peter Kernhof. Retrieved from https://idiyas.com/inventor/jurgen-peter-kernhof

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jürgen Peter Kernhof: Innovator in Position Sensor Technology

Introduction

Jürgen Peter Kernhof is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of position sensor technology. His innovative work has led to the development of a unique method for error detection in position sensors.

Latest Patents

Kernhof holds a patent for a "Method for error detection of a position sensor and position sensor." This invention involves a position sensor that detects the movement of a target relative to a sine receiver coil and a cosine receiver coil. It generates corresponding sine and cosine signals, enhancing the accuracy and reliability of position detection.

Career Highlights

Kernhof is currently employed at Renesas Electronics America Inc., where he continues to advance his research and development efforts. His work at Renesas has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Gentjan Qama and Angel Karachomakov. Their combined expertise contributes to the innovative environment at Renesas Electronics.

Conclusion

Jürgen Peter Kernhof is a distinguished inventor whose work in position sensor technology exemplifies innovation and dedication. His contributions are paving the way for advancements in sensor accuracy and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…