This inventor holds 1 USPTO granted patent. Top assignee: Rheinmetall Gmbh. Active years: 1985.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1985
Title: Jurgen Flach: Innovator in Pipe Inspection Technology
Introduction
Jurgen Flach was a notable inventor known for his contributions to the field of pipe inspection technology. He was based in Duesseldorf, Germany, and his work has had a lasting impact on the industry. Flach's innovative approach to determining the position and depth of unevenness in pipe surfaces has paved the way for advancements in non-destructive testing methods.
Latest Patents
Flach held a patent for a method and arrangement using a pair of resonant circuits for determining the position and depth of unevenness in the inner surface of a pipe. This method involves a scanning head that travels through the pipe and is rotatable about the pipe axis. The invention utilizes an inductive or capacitive depth scanning process that operates in a contact-free manner with respect to the inner pipe surface. The scanning head is equipped with a measuring resonant circuit, and the frequencies of both resonant circuits are adjusted to an identical value before measurement. This innovative approach allows for accurate detection of unevenness within the pipe.
Career Highlights
Flach's career was marked by his work at Rheinmetall GmbH, where he developed his patented technology. His dedication to improving pipe inspection methods has made significant contributions to the field. His innovative spirit and technical expertise have left a lasting legacy in the industry.
Collaborations
Throughout his career, Flach collaborated with notable colleagues, including Rigobert Opitz and Heinz Daugart. These collaborations helped to enhance the development and implementation of his innovative technologies.
Conclusion
Jurgen Flach was a pioneering inventor whose work in pipe inspection technology has had a profound impact on the industry. His patented methods continue to influence modern practices in non-destructive testing. Flach's legacy as an innovator will be remembered for years to come.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
