Nuremberg, Germany

Jürgen Dehler

This inventor holds 2 USPTO granted patents. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürgen Dehler. Retrieved from https://idiyas.com/inventor/jurgen-dehler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Years Active: 2020

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2 patents (USPTO):Explore Patents

Title: Jürgen Dehler: Innovator in Mobile X-ray Technology

Introduction

Jürgen Dehler is a notable inventor based in Nuremberg, Germany. He has made significant contributions to the field of medical imaging technology. With a focus on mobile X-ray devices, his work has advanced the capabilities of diagnostic equipment.

Latest Patents

Dehler holds 2 patents that showcase his innovative approach. His latest patents include a "Mobile X-ray device comprising integral flat-panel detector" and a "Flat-panel detector." These inventions reflect his commitment to improving medical imaging technology.

Career Highlights

Throughout his career, Jürgen Dehler has demonstrated a strong dedication to innovation. His work has not only enhanced the functionality of X-ray devices but has also contributed to better patient care. His inventions are recognized for their practicality and efficiency in medical settings.

Collaborations

Dehler has collaborated with talented individuals such as Klaus Hörndler and Martin Törnvik. These partnerships have played a crucial role in the development of his patented technologies.

Conclusion

Jürgen Dehler's contributions to mobile X-ray technology highlight his role as a leading inventor in the field. His patents and collaborations reflect a commitment to advancing medical imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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