This inventor holds 3 USPTO granted patents. Top assignee: Compur-Electronic Gmbh. Active years: 1986-1987.
Company Filing History:
Years Active: 1986-1987
Title: Jurgen Barry - Innovator in Reflectance Measurement Technology
Introduction
Jurgen Barry is a notable inventor based in Munich, Germany. He has made significant contributions to the field of reflectance measurement technology. With a total of 3 patents to his name, Barry continues to push the boundaries of innovation in his area of expertise.
Latest Patents
One of his latest inventions is a "Head for measuring reflectance." This innovative reflectance measuring head is designed to eliminate false readings caused by regular reflections and shiny parts of the sample. By strategically placing multiple transmitters at equal distances from a single receiver, or vice versa, Barry's invention effectively addresses issues related to surface grain, structure, and inhomogeneity. Additionally, the arrangement of transmitters and receivers in a matrix format enhances the accuracy of measurements.
Another significant patent is the "Fiber optic reflectance measurement apparatus." This apparatus ensures even illumination of the measurement field, allowing for the use of compact reflectance measuring heads. The design incorporates discrete beams from transmitters, with their emission areas aligned parallel to the measurement field. The use of light guide cables for both transmitters and receivers further optimizes the performance of this innovative technology.
Career Highlights
Jurgen Barry is currently associated with Compur-Electronic GmbH, where he applies his expertise in developing advanced measurement technologies. His work has garnered attention for its practical applications and innovative solutions in the field.
Collaborations
Barry collaborates with notable professionals in his field, including Karl P. Jansky, enhancing the impact of his inventions through shared knowledge and expertise.
Conclusion
Jurgen Barry's contributions to reflectance measurement technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in measurement accuracy, and his work continues to influence the industry positively.