This inventor holds 4 USPTO granted patents and 2 published patent applications. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: The Innovative Contributions of Juntaek Oh
Introduction
Juntaek Oh is a prominent inventor based in Suwon-si, South Korea. He is known for his significant contributions to the field of optical measurement technologies. His work has led to advancements that enhance the precision of alignment error measurements in various applications.
Latest Patents
Juntaek Oh holds a patent for an "Imaging ellipsometer and method of measuring an overlay error using the same." This innovative method involves directing light onto a reference wafer with known polarization transmittance. An image signal is captured at specific angles, allowing for the calculation of the polarization transmittance of the optical equipment used. The method further extends to measuring a target wafer, generating a portion of the Mueller matrix from the obtained image signal. This patent showcases his expertise in optical technologies and measurement techniques.
Career Highlights
Juntaek Oh is currently employed at Samsung Electronics Ltd., where he continues to push the boundaries of innovation in optical measurement. His work at such a prestigious company highlights his skills and the importance of his contributions to the industry.
Collaborations
Throughout his career, Juntaek Oh has collaborated with talented individuals such as Jaehyeon Son and Myungjun Lee. These collaborations have likely fostered an environment of creativity and innovation, leading to further advancements in their respective fields.
Conclusion
Juntaek Oh's contributions to optical measurement technologies through his patent and work at Samsung Electronics Ltd. exemplify the impact of innovative thinking in the industry. His dedication to advancing measurement techniques continues to influence the field positively.