This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Junseong Yoon: Innovator in Overlay Reference Wavelength Determination
Introduction
Junseong Yoon is a prominent inventor based in Suwon, South Korea. He has made significant contributions to the field of optical measurement technologies. His innovative work focuses on methods that enhance the precision of overlay reference wavelength determination.
Latest Patents
Junseong Yoon holds a patent titled "Methods of determining overlayer reference wavelength." This patent describes a method that involves forming a pattern structure with a wafer and overlay keys. The process includes obtaining first setup values for various measurement wavelengths and selecting second measurement wavelengths based on these values. The method aims to improve the accuracy of overlay key measurements, which is crucial in semiconductor manufacturing.
Career Highlights
Yoon is currently employed at Samsung Electronics Ltd., a leading global technology company. His work at Samsung has allowed him to apply his expertise in optical measurement and contribute to advancements in the semiconductor industry. His innovative approach has garnered attention within the field.
Collaborations
Junseong Yoon has collaborated with notable colleagues, including Byeongseon Park and Min-Cheol Kwak. These collaborations have fostered a productive environment for innovation and have led to significant advancements in their respective projects.
Conclusion
Junseong Yoon's contributions to the field of overlay reference wavelength determination exemplify the importance of innovation in technology. His work continues to influence the semiconductor industry, showcasing the impact of dedicated inventors in advancing modern technology.