This inventor holds 2 USPTO granted patents. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations of Junseong Lee in Sensor Inspection Technology.
Introduction
Junseong Lee is a notable inventor based in Hwaseong, South Korea. He has made significant contributions to the field of sensor technology, particularly in the method of inspecting sensors. His innovative approach has garnered attention in the industry, showcasing his expertise and dedication to advancing technology.
Latest Patents
Junseong Lee holds a patent for a "Method of inspecting a sensor." This method involves generating a first model based on big data, which includes inspection results for sensors of the same type connected to a current inspection environment. The process includes generating target characteristic coefficients for channels in the first model, as well as characteristic coefficients for channels in the current sensor. Additionally, it involves generating compensation coefficients for the channels based on the target and characteristic coefficients. This patent highlights his innovative approach to improving sensor inspection processes.
Career Highlights
Junseong Lee is currently employed at Samsung Display Co., Ltd., where he continues to work on cutting-edge technologies. His role at Samsung Display allows him to collaborate with other talented professionals in the field, further enhancing his contributions to sensor technology.
Collaborations
Some of Junseong Lee's coworkers include Keeyong Kim and Jun-young Ko. Their collaboration fosters a creative environment that encourages innovation and the development of new technologies.
Conclusion
Junseong Lee's work in sensor inspection technology exemplifies the impact of innovative thinking in the field. His patent and contributions at Samsung Display Co., Ltd. reflect his commitment to advancing technology and improving sensor inspection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile