Ota, Japan

Junko Ozaki

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junko Ozaki. Retrieved from https://idiyas.com/inventor/junko-ozaki-u4477bku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Junko Ozaki - Innovator in Competition Scoring Technology

Introduction

Junko Ozaki is a prominent inventor based in Ota, Japan. She has made significant contributions to the field of competition scoring technology. Her innovative approach has led to the development of a unique method that enhances the scoring process in competitive performances.

Latest Patents

Junko Ozaki holds a patent for a "Method of competition scoring, non-transitory computer readable recording medium, and competition scoring apparatus." This invention focuses on a display method for outputting results of scoring in a performance-based competition. The method involves obtaining input information related to the scoring competition, recognizing various elements of the performance, and determining the difficulty level of each element. It also includes limiting the scoring targets based on these difficulty levels and outputting a comprehensive scoring screen that displays the elements, their difficulty levels, aggregate results, individual scores, and a 3D model of the athlete.

Career Highlights

Junko Ozaki is currently associated with Fujitsu Corporation, where she applies her expertise in technology and innovation. Her work at Fujitsu has allowed her to collaborate with other professionals in the field, further enhancing her contributions to competition scoring technology.

Conclusion

Junko Ozaki's innovative work in competition scoring technology exemplifies her dedication to improving performance evaluation methods. Her patent reflects her commitment to advancing technology in this area, making her a notable figure in the field of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…