Hamamatsu, Japan

Junji Okuma

This inventor holds 27 USPTO granted patents and 6 published patent applications and 2 EPO patents, primarily in Laser Processing Technology. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junji Okuma. Retrieved from https://idiyas.com/inventor/junji-okuma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 27 

% Patents Active = 100.0

 

Average Co-Inventor Count = 1.7

ph-index = 5

Forward Citations = 60(Granted Patents)


Company Filing History:


Years Active: 2016-2026

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Areas of Expertise:
Laser Processing
Laser Machining
Wafer Processing
Light Irradiation
Distance Measurement
Collimation Evaluation
Laser Output Device
Laser Beam Irradiation
Machining Object Cutting
Laser Processing Machine
Laser Processing Method
Autocorrelation Measurement
27 patents (USPTO):Explore Patents

Title: Junji Okuma - Innovative Inventor from Hamamatsu

Introduction: Junji Okuma is a renowned inventor hailing from Hamamatsu, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Junji Okuma holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With over two decades of experience in the industry, Junji Okuma has worked with leading research institutions and companies to develop cutting-edge solutions that have revolutionized the way we approach modern challenges.

Collaborations: Throughout his career, Junji Okuma has collaborated with top engineers, scientists, and innovators from around the world, fostering a culture of creativity and excellence in all his projects.

Conclusion: Junji Okuma's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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