Company Filing History:
1 out of 42,508 
1 out of 2 Years Active: 1990
Title: Junichiro Tomizawa: Innovator in Electron Microscopy
Introduction
Junichiro Tomizawa is a notable inventor from Katsuta, Japan, recognized for his contributions to the field of electron microscopy. He holds a patent for a focusing apparatus that enhances the precision of electron beam applications in microscopy.
Latest Patents
Tomizawa's patent, titled "Focusing apparatus of electron microscope," presents a sophisticated mechanism for focusing an electron beam through a focusing lens onto a sample. This apparatus includes a deflecting means that allows the electron beam to scan the sample, an astigmatism correcting means for the electron beam, and a detecting means that captures second electrons emitted from the sample during scanning. The invention also features an optimum exciting current determining means for the focusing lens, which calculates the ideal current by analyzing the centroid position of a specific area defined by a curve and a straight line. This innovation enables the accurate and straightforward determination of the optimum exciting current for the focusing lens, ensuring minimal confusion in the electron beam's focus.
Career Highlights
Throughout his career, Junichiro Tomizawa has worked with prominent companies, including Hitachi, Ltd. and Hitachi Naka Seiki, Ltd. His experience in these organizations has contributed significantly to his expertise in electron microscopy and related technologies.
Collaborations
One of Tomizawa's notable collaborators is Susumu Ozasa, with whom he has worked on various projects in the field of electron microscopy.
Conclusion
Junichiro Tomizawa's innovative work in developing a focusing apparatus for electron microscopes has made a significant impact on the field. His contributions continue to influence advancements in microscopy technology.