Sagamihara, Japan

Junichi Taguchi


Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 27(Granted Patents)


Location History:

  • Tokyo, JP (2016)
  • Sagamihara, JP (1999 - 2020)

Company Filing History:


Years Active: 1999-2020

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7 patents (USPTO):Explore Patents

Title: Junichi Taguchi: Innovator in Semiconductor Inspection Technology

Introduction

Junichi Taguchi is a prominent inventor based in Sagamihara, Japan. He has made significant contributions to the field of semiconductor inspection technology, holding a total of 7 patents. His work focuses on enhancing the accuracy and efficiency of semiconductor inspection processes.

Latest Patents

One of Taguchi's latest patents is a pattern matching apparatus and computer program. This invention aims to provide a semiconductor inspection apparatus that can effectively carry out position alignment and accurately determine whether the alignment has been successful or has failed, without requiring operator intervention. This is particularly useful when dealing with images that have few characteristics or complicated shapes. The apparatus includes various components such as imaging means, storage for inspected images, and a position alignment section that utilizes design-data ROI images to identify matching positions between inspected and design-data images.

Another notable patent involves an image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus. This invention includes features such as interpolation process image acquisition means, Fourier transform means, and inverse Fourier transform means, all designed to enhance the accuracy of image processing in semiconductor applications.

Career Highlights

Throughout his career, Junichi Taguchi has worked with reputable companies, including Hitachi High-Technologies Corporation and Hitachi, Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas in semiconductor technology.

Collaborations

Taguchi has collaborated with notable colleagues such as Mitsuji Ikeda and Yuichi Abe. Their combined expertise has contributed to advancements in the field of semiconductor inspection.

Conclusion

Junichi Taguchi's contributions to semiconductor inspection technology through his patents and collaborations highlight his role as an influential inventor in this critical field. His work continues to impact the efficiency and accuracy of semiconductor manufacturing processes.

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