This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Junichi Shimanuki: Inventor in Electron Microscopy
Introduction
Junichi Shimanuki is an inventor associated with Kanagawa, Japan. His patent work includes a method for observing defects in amorphous materials using transmission electron microscopy.
Latest Patents
Shimanuki is credited with 1 patent: “Method of Observation by Transmission Electron Microscopy.” The method directs an electron beam into an amorphous material, removes the generated diffraction wave so that the image is formed only by the transmitted wave, and observes the image under an under-focus condition. This approach is intended to make defects in amorphous materials observable.
Career Highlights
Shimanuki is associated with Matsushita Electric Industrial Co., Ltd. His patent reflects work at the intersection of materials analysis and electron microscopy.
Collaborations
His listed coworkers include Yasuhide Inoue and Hirotaro Mori.
Conclusion
Junichi Shimanuki’s recorded invention applies transmission electron microscopy to the observation of defects in amorphous materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile