KUMAMOTO, Japan

Junichi Miyashita

This inventor holds 1 USPTO granted patent. Top assignee: Sony Semiconductor Solutions Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junichi Miyashita. Retrieved from https://idiyas.com/inventor/junichi-miyashita-hp2ph42l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Junichi Miyashita: Innovator in Spectral Sensitivity Measurement

Introduction

Junichi Miyashita is a notable inventor based in Kumamoto, Japan. He has made significant contributions to the field of imaging technology, particularly in the measurement of spectral sensitivity. His work is recognized for its precision and innovation.

Latest Patents

Miyashita holds a patent for a spectral sensitivity measuring device and method. This device is designed to accurately measure the spectral sensitivity of imaging devices. The technology includes a chart generation system that creates a chart with color regions positioned opposite the imaging device. Additionally, a processing system calculates the spectral sensitivity based on the captured image of the chart. This invention enhances the accuracy of spectral sensitivity measurements in imaging devices.

Career Highlights

Junichi Miyashita is associated with Sony Semiconductor Solutions Corporation, where he applies his expertise in imaging technology. His work has contributed to advancements in the field, showcasing his commitment to innovation and quality.

Collaborations

Miyashita has collaborated with notable colleagues, including Ryouji Taniguchi and Soichi Kuwahara. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Junichi Miyashita's contributions to spectral sensitivity measurement reflect his dedication to innovation in imaging technology. His patent and collaborations highlight his role as a key figure in this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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