Tokyo, Japan

Junichi Fujiwara

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Japan Tobacco Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junichi Fujiwara. Retrieved from https://idiyas.com/inventor/junichi-fujiwara-ldaw75ci

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2003

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Junichi Fujiwara: Innovator in Tobacco Manufacturing

Introduction

Junichi Fujiwara is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of tobacco manufacturing, particularly through his innovative methods and systems.

Latest Patents

Fujiwara holds a patent for a manufacturing method for cut tobacco. This method involves adding a first additive, primarily a humectant, to laminar tobacco. The laminar tobacco, now enhanced with the first additive, is shredded to create cut tobacco. Following this, a second additive containing a perfume is introduced to the cut tobacco. The cut tobacco is then dried, and a top flavoring, serving as a third additive, is added to the dried product.

Career Highlights

Fujiwara is associated with Japan Tobacco Inc., where he has been instrumental in developing advanced manufacturing techniques. His work has contributed to improving the quality and flavor of cut tobacco products.

Collaborations

He has collaborated with notable coworkers, including Yukio Nakanishi and Kazue Takase, who have also contributed to advancements in tobacco manufacturing.

Conclusion

Junichi Fujiwara's innovative approach to tobacco manufacturing showcases his expertise and commitment to enhancing product quality. His patent reflects a significant advancement in the industry, demonstrating the importance of innovation in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…