Muroran, Japan

Junichi Fujisawa

This inventor holds 1 USPTO granted patent. Top assignees: Eddio Corporation, Nippon Steel Corporation. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junichi Fujisawa. Retrieved from https://idiyas.com/inventor/junichi-fujisawa-awjy3hc2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Junichi Fujisawa: Innovator in Non-Destructive Testing

Introduction

Junichi Fujisawa is a notable inventor based in Muroran, Japan. He has made significant contributions to the field of non-destructive testing, particularly in the detection of defects in metal. His innovative approach has garnered attention in various industrial sectors.

Latest Patents

Fujisawa holds a patent for a "Method and apparatus for non-destructively detecting defects in metal." This invention showcases his expertise in developing techniques that ensure the integrity of metal structures without causing damage.

Career Highlights

Throughout his career, Fujisawa has worked with prominent companies, including Nippon Steel Corporation and Eddio Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in metal testing technologies.

Collaborations

Fujisawa has collaborated with esteemed colleagues such as Michiaki Takahashi and Mitsuo Yoshida. These partnerships have fostered innovation and have been instrumental in the development of new methodologies in the field.

Conclusion

Junichi Fujisawa's contributions to non-destructive testing highlight his role as a key innovator in the industry. His patent and collaborations reflect his commitment to advancing technology in metal detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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