Seoul, South Korea

Junhak Lee

USPTO Granted Patents = 8 

 

Average Co-Inventor Count = 3.6

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Pyeongtaek-si, KR (2016)
  • Seoul, KR (2014 - 2020)

Company Filing History:


Years Active: 2014-2020

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8 patents (USPTO):Explore Patents

Title: Innovations of Junhak Lee in Biometric Authentication

Introduction

Junhak Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of biometric authentication, holding a total of 8 patents. His work focuses on enhancing security measures through innovative digital devices.

Latest Patents

One of Junhak Lee's latest patents is a digital device that incorporates a camera unit and a display unit. This device is designed to perform biometric authentication by capturing face image data and vein image data. The first authentication process compares the captured face image data with pre-stored data, while the second process utilizes vein image data for a more secure authentication level. Another notable patent is the foot vein authentication device, which detects vein patterns on the inside of a user's foot. This device includes a sensor unit that emits infrared rays and an image acquisition unit to capture the vein pattern for user authentication.

Career Highlights

Junhak Lee is currently employed at LG Electronics Inc., where he continues to innovate in the field of biometric technology. His work has been instrumental in developing advanced security solutions that are both effective and user-friendly.

Collaborations

Some of Junhak Lee's coworkers include Chaedeok Lee and Hyungchul Won. Their collaborative efforts contribute to the ongoing advancements in biometric authentication technologies.

Conclusion

Junhak Lee's contributions to biometric authentication through his innovative patents demonstrate his commitment to enhancing security in digital devices. His work at LG Electronics Inc. continues to pave the way for future advancements in this critical field.

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