Jungyeun Kim

Title: Jungyeun Kim and RTL Error Detection

Introduction

Jungyeun Kim is an inventor based in Seoul, South Korea, associated with Telechips Inc. His patent work addresses error detection in register-transfer-level (RTL) modules, with a focus on identifying faults in functional blocks and comparators.

Latest Patents

The available information lists one patent for Kim: Error Detection System Applicable to RTL Module and Operation Method Thereof. The method uses two functional blocks that perform the same function on the same input and produce separate electrical signals. Two comparators compare those signals and provide comparison results, which are used to determine whether an error occurred in either functional block or comparator. Depending on the determination, the system outputs an error report signal or a latent fault report signal. Kim’s listed patent portfolio comprises 1 patent.

Career Highlights

Kim’s listed invention concerns hardware reliability and fault monitoring in RTL modules. By using redundant functional blocks and multiple comparators, the disclosed approach aims to detect errors and report potential latent faults.

Collaborations

The provided information identifies Yeongbeen Kim and Jae Yoep Jeong as Kim’s coworkers. It does not specify their roles or contributions to the patent.

Conclusion

Jungyeun Kim’s listed patent focuses on detecting and reporting faults in RTL modules through redundant processing and comparison, reflecting an emphasis on hardware error monitoring.