Suwon, South Korea

Jungsuk Park

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jungsuk Park. Retrieved from https://idiyas.com/inventor/jungsuk-park

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovator Profile: Jungsuk Park

Introduction

Jungsuk Park is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of image processing technology. His innovative work has led to the development of a patent that enhances the efficiency of image data processing.

Latest Patents

Jungsuk Park holds a patent for a "Controller for processing image data, image processing system including controller, and method of operating controller." This invention involves a method of operating a controller that processes image data by receiving image data from an image sensor. The method includes verifying a signature value of the image data using vehicle speed, which enhances the accuracy and reliability of image processing.

Career Highlights

Jungsuk Park is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His role involves working on advanced image processing systems that are crucial for various applications in consumer electronics.

Collaborations

Jungsuk Park collaborates with his coworker, Sigyoung Koo, to further innovate in the field of image processing. Their combined expertise contributes to the development of cutting-edge technologies at Samsung Electronics.

Conclusion

Jungsuk Park's contributions to image processing technology exemplify the spirit of innovation. His patent and work at Samsung Electronics highlight his role as a key player in advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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