Ansan, South Korea

Jungmin Choi

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Vieworks Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jungmin Choi. Retrieved from https://idiyas.com/inventor/jungmin-choi-tyedpja6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jungmin Choi: Inventor of a Flexible Radiation Detector

Introduction

Jungmin Choi is an inventor associated with Ansan, South Korea, and Vieworks Co., Ltd. His patent work includes a flexible detector designed to support radiation detection in an imaging device.

Latest Patents

The available information identifies one patent associated with Choi: Flexible Detector and Imaging Device Including the Same. The invention describes a deformable panel assembly with a detection panel configured to detect radiation, protected on both sides by first and second protection panels. A main frame is coupled to one side of the panel, while an end frame is coupled to the opposite side. The detection and protection panels extend in the same direction, forming a flexible detector that can be incorporated into an imaging device. Choi is credited with 1 patent.

Career Highlights

Choi’s listed patent reflects work on detector construction and radiation-imaging technology. The patent record associates him with Vieworks Co., Ltd., a company connected to imaging products.

Collaborations

The available information links Choi’s patent to Vieworks Co., Ltd. It does not specify additional collaborators or describe the details of his role at the company.

Conclusion

Jungmin Choi’s documented invention focuses on a flexible, framed radiation detector for imaging applications, highlighting his contribution to detector design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…