Solna, Sweden

Jungha Lee

This inventor holds 1 USPTO granted patent. Top assignee: Flir Systems Ab. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jungha Lee. Retrieved from https://idiyas.com/inventor/jungha-lee-cwqw88bi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2020

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Jungha Lee

Introduction

Jungha Lee is a notable inventor based in Solna, Sweden. He has made significant contributions to the field of technology, particularly in the development of camera systems. His innovative work has led to the granting of a patent, showcasing his expertise and creativity in the industry.

Latest Patents

Jungha Lee holds a patent for a camera, which reflects his commitment to advancing imaging technology. This patent is a testament to his ability to create solutions that meet the demands of modern applications.

Career Highlights

Currently, Jungha Lee is employed at FLIR Systems AB, a company known for its cutting-edge thermal imaging and sensing technologies. His role at FLIR Systems AB allows him to work on innovative projects that push the boundaries of what is possible in imaging technology.

Collaborations

Throughout his career, Jungha Lee has collaborated with talented individuals such as Christian Högstedt and Anton Hoffman. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Jungha Lee's contributions to the field of camera technology and his work at FLIR Systems AB highlight his role as an influential inventor. His patent and collaborations demonstrate his commitment to innovation and excellence in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…