Jung Won Kim

Title: Innovations by Jung Won Kim in Optical Device Measurement

Introduction

Jung Won Kim is a notable inventor based in Taejon, South Korea. He has made significant contributions to the field of optical device measurement, particularly through his innovative patent. His work focuses on improving the accuracy and efficiency of measuring polarization-dependent loss in optical devices.

Latest Patents

Jung Won Kim holds a patent for an "Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling." This invention discloses a method for measuring the changing amount of insertion loss of an optical device based on the polarization state of incident light. The apparatus utilizes a polarization scrambler that includes a piezoelectric element type optical fiber birefringence modulator. An optical detector measures the intensity of the light passing through the testing optical device. The measured intensity values are averaged over a constant period of birefringence modulation, allowing for the computation of polarization-dependent loss from the ratio of maximum to minimum power during that period. This innovative approach shortens measuring time and minimizes the impact of external disturbances on the incident light, leading to precise measurements of polarization-dependent loss.

Career Highlights

Jung Won Kim is currently associated with Donam Systems Inc., where he continues to develop and refine his inventions. His expertise in optical measurements has positioned him as a valuable asset in the field.

Collaborations

He has collaborated with notable colleagues, including Yeon Wan Koh and Bong Wan Lee, contributing to advancements in their shared field of research.

Conclusion

Jung Won Kim's innovative work in measuring polarization-dependent loss has the potential to significantly enhance the performance of optical devices. His contributions reflect a commitment to advancing technology in this critical area.