Hsinchu, Taiwan

Jung-Wei Liao

This inventor holds 1 USPTO granted patent. Top assignee: National Tsing Hua University. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung-Wei Liao. Retrieved from https://idiyas.com/inventor/jung-wei-liao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Jung-Wei Liao: Innovator in Magnetic Recording Technology

Introduction

Jung-Wei Liao is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of magnetic recording technology. His innovative work has led to the development of a unique patent that enhances data storage capabilities.

Latest Patents

Jung-Wei Liao holds a patent for a perpendicular magnetic recording medium. This invention includes a substrate, an antiferromagnetic layer disposed above the substrate, and a perpendicular magnetic recording layer formed on the antiferromagnetic layer. The recording layer is exchange-coupled to the antiferromagnetic layer, which improves the efficiency and reliability of data storage.

Career Highlights

Liao is affiliated with National Tsing Hua University, where he continues to engage in research and development. His work at the university has positioned him as a key figure in advancing magnetic recording technologies.

Collaborations

Some of his notable coworkers include Meng-Shian Lin and Chih-Huang Lai. Their collaborative efforts contribute to the innovative research environment at National Tsing Hua University.

Conclusion

Jung-Wei Liao's contributions to magnetic recording technology exemplify the impact of innovative thinking in the field of data storage. His patent reflects a significant advancement that could influence future developments in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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